APMon - Advanced Particle Monitoring System

The system allows for the first time the continuous monitoring of surface contamination by large particles. It opens up analytical possibilities in cleanrooms beyond ISO Class 5, where continuous, extractive particle monitoring systems are inherently not applicable.

APMON is an analysis system specifically designed for continuous monitoring of large particles (> 20 micrometers). This application is made possible by further developing the traditional sedimentation plate microscopy method into a fully automatic and continuous analyzer. Specifically, a laser-optical process detects the sedimentation of large particles onto an array of test surfaces. Changes in the particle occupancy are recorded and displayed as particle count and particle distribution at the end of a specific time period (from 5 minutes onwards).

APMON not only extends conventional monitoring strategies towards larger particles but also serves as a highly efficient alternative to manual and labor-intensive sedimentation plate measurements.

An APMON system consists of a central unit for data collection/storage/visualization and external sensors for sedimentation analysis. The physical connection is via Ethernet or (in smaller systems with two sensors) even wirelessly via Bluetooth. Therefore, an APMON monitoring system is associated with minimal installation effort and can quite rightly be described as "plug and play".

• Analysis system for real-time detection of surface contamination
  • Especially detects large particles
  • Particle count and particle distribution
  • Determination of the Particle Deposition Rate (PDR) according to upcoming ISO 14644–3
  • Determination of the Particle Deposition Class (PDC) according to ISO 14644-9
  • Graphical representation of surface cleanliness
  • Ready-to-use system – no pumps, sampling lines, or other complex infrastructure necessary
  • System scalable to 6 sensors per evaluation unit