Hier finden Sie das NEWSLETTER Archiv Mehr ...
HJM Vaisala PPS MT-Messtechnik

reinraum online
Deutsch   English


Alle Veröffentlichungen von IMEC Belgium

Figure 1 – From FinFET to nanosheet (with buried power rails (BPRs)), forksheet and CFET. Figure 2 – Layout of SRAM half cells for a) FinFET, b) gate-all-around nanosheet and c) forksheet. The forksheet can provide up to 30% scaling of the bit cell height as the p-n space is not governed by gate extension (GE), gate cut (GE) or dummy fin gate tuck (DFGT).

TCAD simulations of a new forksheet device show 10 percent performance boost and 20 percent cell area reduction compared to gate-all-around nanosheet devices.

Imec presents forksheet device as the ultimate solution to push scaling towards the 2nm technology node

This week, at the 2019 IEEE International Electron Devices Meeting, imec, a world-leading research and innovation hub in nanoelectronics and digital technologies, presents first standard cell simulation results of its forksheet device designed for sub-3nm logic technology nodes. Compared to nanoshee…

Imec Lisbet Lagae

SCALPEL Project to Develop Scalable Microfluidic Platform that Analyzes and Sorts Single Cells to greatly simplify Cancer Research and Treatment follow up.

Imec’s Liesbet Lagae Awarded Prestigious European Research Council Grant

Imec, a world leading nanoelectronics research center, proudly announces that Prof. Dr. Liesbet Lagae, R&D Manager Life Science Technologies at imec and professor in Nanobio Physics at KU Leuven, has been awarded a Consolidator Grant for her research project SCALPEL* by the European Research Cou…

Graph: Etching at cryogenic temperature results in targeted k-value

New method allows IC manufacturers to reach scaling levels at 20nm and beyond, without compromising speed and device cross-talk

Imec reveals method of damage free cryogenic etching of ultralow-k dielectrics

Imec today announced a cryogenic etching method that protects the surface of porous ultralow-k dielectrics against excessive plasma induced damages.

As semiconductor technology scales below the 20nm node, the capacitance increases between nearby conductive portions of high-density integrated circuits…

Besser informiert: Mit JAHRBUCH, NEWSLETTER, NEWSFLASH und EXPERTEN VERZEICHNIS

Bleiben Sie auf dem Laufenden und abonnieren Sie unseren monatlichen eMail-NEWSLETTER und unseren NEWSFLASH. Lassen Sie sich zusätzlich mit unserem gedruckten JAHRBUCH darüber informieren, was in der Welt der Reinräume passiert. Und erfahren Sie mit unserem Verzeichnis, wer die EXPERTEN im Reinraum sind.

Ecolab ClearClean ASYS Becker