

Leica DCM8 Unites Advantages of High-Definition Confocal Microscopy and Interferometry in One Instrument
Leica Microsystems Launches 3D Surface Metrology Solution
Leica Microsystems launches the Leica DCM8 for non-destructive three-dimensional surface profiling. The instrument is a combined confocal and interferometric optical profiler and therefore provides the benefits of both technologies: high definition confocal microscopy for high lateral resolution and…