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All publications from Fraunhofer-Institut für Photonische Mikrosysteme IPMS

eBeam-Metrologiegeräte von Applied Materials im Reinraum des Fraunhofer IPMS. © Fraunhofer IPMS / Applied Materials’ eBeam metrology equipment at cleanroom of Fraunhofer IPMS. © Fraunhofer IPMS
  • Electronics (wafers, semiconductors, microchips,...)

Launch of European Semiconductor- Metrology Technology Hub

Applied Materials and Fraunhofer IPMS launch European Semiconductor- Metrology Technology Hub

– New hub will provide state-of-the-art metrology systems to accelerate semiconductor research and enhance development projects with chipmakers and ecosystem partners across Europe, particularly in ICAPS* market segments
– Collaboration to accelerate learning, develop novel methods and prove new me…

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Vaisala MT-Messtechnik Becker Steris