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All publications from Leica Microsystems GmbH

The Leica DMS300 Cleanliness Expert microscope system allows length and width measurements of the smallest particles up to 20 micrometers as well as differentiation between reflective and non-reflective particles.

From Macroscopic Scale to Tiniest Detail – Tailor-Made Cleanliness Analysis Leica Application Suite (LAS) Cleanliness Expert Now Available for a Broader Range of Microscope Systems

Leica Microsystems’ software module Leica Application Suite (LAS) Cleanliness Expert is now available for a broader range of microscopes. More users with a wider range of requirements will benefit from the precise measurements this tool offers to the industrial sector. Leica Cleanliness Expert perfo…

Working with highest precision: Leica M205 FA with transmitted light base Leica TL5000 Ergo and Leica LMT260 XY scanning stage

Leica LMT260 XY Scanning Stage for a Repeatability of 0.25 µm at a Resolution of 5 nm

Leica Microsystems Launches High-Precision Scanning Stage for Stereo Microscopes and Macroscopes

Leica Microsystems launches a high-precision scanning stage for stereo microscopes and macroscopes, the Leica LMT260 XY Scanning Stage. To ensure successful experiments, it offers a repeatability of 0.25 µm for samples weighing less than 0.5 kg, and of 1 µm for heavier loads of 1.5 kg. This repeatab…

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